Počet záznamů: 1
Microcrystalline silicon thin films studied by photoconductive atomic force microscopy
- 1.Ledinský, Martin - Vetushka, Aliaksi - Stuchlík, Jiří - Rezek, Bohuslav - Fejfar, Antonín - Kočka, Jan
Microcrystalline silicon thin films studied by photoconductive atomic force microscopy.
ICANS 24. Program and Abstracts Book. Nara, 2011. s. 233-233.
[International Conference on Amorphous and Nanocrystalline Semiconductors /24./ - ICANS 24. 21.08.2011-26.08.2011, Nara]
http://hdl.handle.net/11104/0219806
Počet záznamů: 1