Počet záznamů: 1
Noncontact Atomic Force Microscopy. Volume 2
- 1.Pou, P. - Jelínek, Pavel - Pérez, R.
Basic mechanisms for single atom manipulation in semiconductor systems with the FM-AFM.
Noncontact Atomic Force Microscopy. Volume 2. Berlin: Springer, 2009 - (Morita, S.; Giessibl, F.; Wiesendanger, R.), s. 227-248. Nanoscience and Technology. ISBN 978-3-642-01494-9
http://hdl.handle.net/11104/0185275
Počet záznamů: 1