0481772 - FZÚ 2018 RIV US eng J - Článek v odborném periodiku
Kopeček, Jaromír - Jurek, Karel - Kopecký, Vít - Klimša, Ladislav - Seiner, Hanuš - Sedlák, Petr - Landa, Michal - Dluhoš, J. - Petrenec, M. - Hladík, L. - Doupal, A. - Heczko, Oleg
Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl.
Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA ČR(CZ) GA14-03044S
Institucionální podpora: RVO:68378271 ; RVO:61388998
Klíčová slova: scanning electron microscope * SEM * focused ion beam * FIB * xenon plasma focused ion beam * dual beam * shape memory alloy * SMA
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 1.872, rok: 2014

Trvalý link: http://hdl.handle.net/11104/0277259