Počet záznamů: 1
Reflected and transmitted mode in the scanning low energy electron microscope
- 1.0467260 - ÚPT 2017 JP eng C - Konferenční příspěvek (zahraniční konf.)
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Pokorná, Zuzana - Frank, Luděk
Reflected and transmitted mode in the scanning low energy electron microscope.
2nd Forum of Center for ADvanced Materials Research and International Collaboration (CAMRIC-FORUM2). Toyama: University of Toyama, 2016, s. 29-30.
[Forum of Center for ADvanced Materials Research and International Collaboration /2./ (CAMRIC-FORUM2). Toyama (JP), 13.10.2016-14.10.2016]
Grant CEP: GA TA ČR(CZ) TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: SLEEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen for observation through the specimen for observation throughout the full energy scale down to units of electronvolts.
Trvalý link: http://hdl.handle.net/11104/0265401
Počet záznamů: 1