Počet záznamů: 1
Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
- 1.0555695 - ÚFP 2022 RIV CH eng J - Článek v odborném periodiku
Arezki, Y. - Su, R. - Heikkinen, V. - Leprete, F. - Psota, Pavel - Bitou, Y. - Schober, C. - Mehdi-Souzani, C. - Alzahrani, B. A. M. - Zhang, X. - Kondo, Y. - Prüss, J. - Lédl, Vít - Anwer, N. - Bouazizi, M. L. - Leach, R. - Nouira, H.
Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level.
Sensors. Roč. 21, č. 4 (2021), s. 1-19, č. článku 1103. E-ISSN 1424-8220
Institucionální podpora: RVO:61389021
Klíčová slova: Aspheric and freeform optical elements * Dimensional metrology * Measured data evaluation * Robust reference minimum zone (Hybrid Trust Region) fitting * Ultra-high precision measuring machine * Uncertainty
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 3.847, rok: 2021
Způsob publikování: Open access
https://www.mdpi.com/1424-8220/21/4/1103
Trvalý link: http://hdl.handle.net/11104/0330159
Počet záznamů: 1