Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

0545328 - FZÚ 2022 RIV DE eng J - Článek v odborném periodiku
Tkachenko, V. - Lipp, V. - Buescher, M. - Capotondi, F. - Hoeppner, H. - Medvedev, Nikita - Pedersoli, E. - Prandolini, M.J. - Rossi, G.M. - Tavella, F. - Toleikis, S. - Windeler, M. - Ziaja, B. - Teubner, U.
Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride.
Scientific Reports. Roč. 11, č. 1 (2021), č. článku 5203. ISSN 2045-2322. E-ISSN 2045-2322
Grant CEP: GA MŠMT LTT17015
GRANT EU: European Commission(XE) 654148 - LASERLAB-EUROPE
Institucionální podpora: RVO:68378271
Klíčová slova: temporal diagnostics of FEL pulses * optical properties of silicon nitride irradiated by XUV and soft X-ray
Obor OECD: Fluids and plasma physics (including surface physics)
Impakt faktor: 4.997, rok: 2021
Způsob publikování: Open access
Trvalý link: http://hdl.handle.net/11104/0322052