Počet záznamů: 1
Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering
SYS 0541681 LBL 01000a^^22220027750^450 005 20240103225705.4 014 $a 85101331505 $2 SCOPUS 014 $a 000624474700005 $2 WOS 017 70
$a 10.1016/j.apsusc.2021.149254 $2 DOI 100 $a 20210414d m y slo 03 ba 101 0-
$a eng 102 $a NL 200 1-
$a Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering 215 $a 9 s. 463 -1
$1 001 cav_un_epca*0256173 $1 011 $a 0169-4332 $e 1873-5584 $1 200 1 $a Applied Surface Science $v Roč. 548, MAY 2021 (2021) $1 210 $c Elsevier 608 $a Article 610 $a Photoinduced Resist-free Imprinting (PRI) 610 $a Grazing Incidence Small-angle X-ray Scattering (GISAXS) 610 $a Laser Induced Periodic Surface Structures (LIPSS) 610 $a Fullerene (PCBM) 700 -1
$3 cav_un_auth*0384340 $a Gutiérrez-Fernández $b E. $y ES $4 070 $z K 701 -1
$3 cav_un_auth*0380582 $a Rodriguez $b Álvaro $p UFCH-W $i Odd. elektrochemických materiálů $j Dept. of Electrochemical Materials $y ES $4 070 $T Ústav fyzikální chemie Jaroslava Heyrovského AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0384341 $a García-Gutiérrez $b M. C. $y ES $4 070 701 -1
$3 cav_un_auth*0384342 $a Nogales $b A. $y ES $4 070 701 -1
$3 cav_un_auth*0384344 $a Rebollar $b E. $y ES $4 070 701 -1
$3 cav_un_auth*0245525 $a Solano $b E. $y ES $4 070 701 -1
$3 cav_un_auth*0384343 $a Ezquerra $b T. A. $y ES $4 070 $z K 856 $u http://hdl.handle.net/11104/0319212 $9 RIV
Počet záznamů: 1