Počet záznamů: 1
Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?
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$a Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts? 215 $a 2 s. $c P 463 -1
$1 001 cav_un_epca*0494358 $1 010 $a 978-80-87441-23-7 $1 200 1 $a Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar $v S. 68-69 $1 210 $a Brno $c Institute of Scientific Instruments The Czech Academy of Sciences $d 2018 610 $a secondary electrons 610 $a polymers 610 $a hyperspectral imaging 700 -1
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$3 cav_un_auth*0287343 $a Krátký $b Stanislav $i D2: Speciální technologie $j D2: New Technologies $p UPT-D $w New Technologies $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0101596 $a Mika $b Filip $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i.
Počet záznamů: 1