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Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
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$a Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens. 215 $a 15 s. $c P 463 -1
$1 001 cav_un_epca*0257563 $1 011 $a 0034-6748 $e 1089-7623 $1 200 1 $a Review of Scientific Instruments $v Roč. 87, č. 11 (2016) $1 210 $c AIP Publishing 610 $a Current density 610 $a Etching 610 $a Faraday cups 610 $a Ion beam sources 610 $a Cameras 700 -1
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Počet záznamů: 1