Počet záznamů: 1
Ray tracing, aberration coefficients and intensity distribution
SYS 0350668 LBL 01734^^^^^2200277^^^450 005 20240111140748.0 014 $a 000290773700018 $2 WOS 100 $a 20101201d m y slo 03 ba 101 0-
$a eng 102 $a CZ 200 1-
$a Ray tracing, aberration coefficients and intensity distribution 215 $a 4 s. 463 -1
$1 001 cav_un_epca*0350656 $1 010 $a 978-80-254-6842-5 $1 200 1 $a Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation $v S. 49-52 $1 210 $a Brno $c Institute of Scientific Instruments AS CR, v.v.i $d 2010 $1 702 1 $a Mika $b F. $4 340 610 0-
$a ray tracing 610 0-
$a aberration coefficients 610 0-
$a intensity distribution 700 -1
$3 cav_un_auth*0101603 $a Oral $b Martin $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $4 070 $T Ústav přístrojové techniky AV ČR, v. v. i.
Počet záznamů: 1