Počet záznamů: 1
LPE growth of InP layers from rare-earth treated melts for radiation detector structures
SYS 0341444 LBL 01802^^^^^2200313^^^450 005 20240103193339.8 014 $a 000272777100024 $2 WOS 017 $a 10.1016/j.mseb.2009.03.004 $2 DOI 100 $a 20100319d m y slo 03 ba 101 0-
$a eng 102 $a CH 200 1-
$a LPE growth of InP layers from rare-earth treated melts for radiation detector structures 215 $a 4 s. 463 -1
$1 001 cav_un_epca*0257217 $1 011 $a 0921-5107 $e 1873-4944 $1 200 1 $a Materials Science and Engineering B-Advanced Functional Solid-State Materials $v Roč. 165, 1-2 (2009), s. 94-97 $1 210 $c Elsevier 610 0-
$a semiconductor technology 610 0-
$a rare earth elements 610 0-
$a III-V semiconductors 700 -1
$3 cav_un_auth*0101663 $a Grym $b Jan $i 003 $j Technology of Materials for Electronics and Optoelectronics $p URE-Y $w Synthesis and characterization of nanomaterials $4 070 $T Ústav fotoniky a elektroniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0101728 $a Procházková $b Olga $i 003 $j Technology of Materials for Electronics and Optoelectronics $p URE-Y $4 070 $T Ústav fotoniky a elektroniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0101767 $a Zavadil $b Jiří $i 004 $j Diagnostics of Materials for Electronics and Optoelectronics $p URE-Y $w Synthesis and characterization of nanomaterials $4 070 $T Ústav fotoniky a elektroniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0101770 $a Žďánský $b Karel $i 004 $j Diagnostics of Materials for Electronics and Optoelectronics $p URE-Y $4 070 $T Ústav fotoniky a elektroniky AV ČR, v. v. i.
Počet záznamů: 1