High-resolution Powder Nano-Beam Diffraction in Scanning Electron Microscopy

Šlouf, M., Skoupý, R., Pavlova, E., Krzyžánek, V. High-resolution Powder Nano-Beam Diffraction in Scanning Electron Microscopy. In: KRZYŽÁNEK, V., HRUBANOVÁ, K., HOZÁK, P., MÜLLEROVÁ, I., ŠLOUF, M., eds. 16th Multinational Congress on Microscopy, 16MCM, 04-09 September 2022, Brno, Czech Republic. Book of abstracts. Brno: Czechoslovak Microscopy Society, 2022, s. 76-77. ISBN 978-80-11-02253-2. Dostupné z: https://www.16mcm.cz/wp-content/uploads/2022/09/16MCM-abstract-book.pdf