Počet záznamů: 1
Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
- 1.Tkachenko, V., Lipp, V., Buescher, M., Capotondi, F., Hoeppner, H., Medvedev, N., Pedersoli, E., Prandolini, M.J., Rossi, G.M., Tavella, F., Toleikis, S., Windeler, M., Ziaja, B., Teubner, U. Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride. Scientific Reports. 2021, 11(1), 5203. ISSN 2045-2322. E-ISSN 2045-2322. Dostupné z: doi: 10.1038/s41598-021-84677-w.
Počet záznamů: 1