XUV Emission from Autoionizing Hole States Induced by Intense XUV-FEL at Intensities up to 1017 W/cm.sup.2./sup..

Rosmej, F.B., Galtier, E., Riley, D., Dzelzainis, T., Heinmann, P., Khattak, F.Y., Lee, W., Nagler, B., Nelson, A., Tschentscher, T., Vinko, S.M., Whitcher, T., Toleikis, S., Fäustlin, R., Soberierski, R., Juha, L., Fajardo, M., Wark, J. S., Chalupský, J., Hájková, V., Krzywinski, J., Jurek, M., Kozlová, M. XUV Emission from Autoionizing Hole States Induced by Intense XUV-FEL at Intensities up to 1017 W/cm². Journal of Physics: Conference Series. 2010, 244(4), 1-4. ISSN 1742-6588. E-ISSN 1742-6596. Dostupné z: doi: 10.1088/1742-6596/244/4/042028