Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements

Ge, Y., Heczko, O., Hannula, S.-P., Fähler, S. Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements. Acta Materialia. 2010, 58(20), 6665-6671. ISSN 1359-6454. E-ISSN 1873-2453. Dostupné z: doi: 10.1016/j.actamat.2010.08.029