Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films

Fejfar, A., Vetushka, A., Kalusová, V., Čertík, O., Ledinský, M., Rezek, B., Stuchlík, J., Kočka, J. Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films. Physica Status Solidi A. 2010, 207(3), 582-586. ISSN 1862-6300. E-ISSN 1862-6319. Dostupné z: doi: 10.1002/pssa.200982907.