Počet záznamů: 1
Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy
- 1.Landa, M., Růžek, M., Sedlák, P., Seiner, H., Bodnárová, L., Zídek, J. Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy. Journal of Physics: Conference Series. 2010, 214(1), 1-5. ISSN 1742-6588. E-ISSN 1742-6596. Dostupné z: doi: 10.1088/1742-6596/214/1/012045.
Počet záznamů: 1