Laser sources at 760 nm wavelength for metrology of length

Mikel, B., Buchta, Z., Lazar, J., Číp, O. Laser sources at 760 nm wavelength for metrology of length. In: Africon 2009. Los Alamitos: IEEE, 2009, 5308091: 1-6. ISBN 978-1-4244-3918-8. Dostupné z: doi: 10.1109/AFRCON.2009.5308091