Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices

MA, H., MIKMEKOVÁ, Š., KONVALINA, I., YIN, X., SUN, F., PIŇOS, J., VAŠKOVICOVÁ, N., PRŮCHA, L., MÜLLEROVÁ, I., MIKMEKOVÁ, E., CHEN, D. Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices. ACS Applied Nano Materials. 2021, 4(4), 3725-3733. ISSN 2574-0970. Dostupné z: doi: 10.1021/acsanm.1c00204.