Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering

GUTIÉRREZ-FERNÁNDEZ, E., RODRIGUEZ, Á., GARCÍA-GUTIÉRREZ, M. C., NOGALES, A., REBOLLAR, E., SOLANO, E., EZQUERRA, T. A. Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering. Applied Surface Science. 2021, 548(MAY 2021), 149254. ISSN 0169-4332. E-ISSN 1873-5584. Dostupné z: doi: 10.1016/j.apsusc.2021.149254.