Počet záznamů: 1
Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
- 1.ZEMEK, J., HOUDKOVÁ, J., JIŘÍČEK, P., IŽÁK, T., KALBÁČ, M. Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy. Applied Surface Science. 2019, 491(Oct), 16-23. ISSN 0169-4332. E-ISSN 1873-5584. Dostupné z: doi: 10.1016/j.apsusc.2019.06.083.
Počet záznamů: 1