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Thickness determination of a cathodoluminescence active nanoparticles by means of Quantitative STEM imaging
- 1.SKOUPÝ, R., KRZYŽÁNEK, V. Thickness determination of a cathodoluminescence active nanoparticles by means of Quantitative STEM imaging. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 74-76. ISBN 978-80-87441-23-7.
Počet záznamů: 1