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Convergence study of isogeometric analysis based on Bezier extraction in electronic structure calculations
- 1.CIMRMAN, R., NOVÁK, M., KOLMAN, R., TŮMA, M., PLEŠEK, J., VACKÁŘ, J. Convergence study of isogeometric analysis based on Bezier extraction in electronic structure calculations. Applied Mathematics and Computation. 2018, 319(Feb), 138-152. ISSN 0096-3003. E-ISSN 1873-5649. Dostupné z: doi: 10.1016/j.amc.2017.02.023
Počet záznamů: 1