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Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
- 1.GERMER, S., PIETAG, F., POLÁK, J., ARNOLD, T. Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens. Review of Scientific Instruments. 2016, 87(11), 113301. ISSN 0034-6748. E-ISSN 1089-7623. Dostupné z: doi: 10.1063/1.4964701.
Počet záznamů: 1