Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples

POKORNÁ, Z., KNÁPEK, A. Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples. In: MIKA, Filip, ed. Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016, s. 48-49. ISBN 978-80-87441-17-6. Dostupné z: http://www.trends.isibrno.cz/