Počet záznamů: 1
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films
- 1.ŠIMEK, D., KUŽEL, R., RAFAJA, D. Reciprocal-space mapping for simultaneous determination of texture and stress in thin films. Journal of Applied Crystallography. 2006, 39(4), 487-501. ISSN 0021-8898. E-ISSN 1600-5767. Dostupné z: doi: 10.1107/S0021889806015500
Počet záznamů: 1