Počet záznamů: 1
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.HOLOVSKÝ, J., DAGKALDIRAN, U., REMEŠ, Z., PURKRT, A., IŽÁK, T., PORUBA, A., VANĚČEK, M. Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates. Physica Status Solidi A. 2010, 207(9), 578-581. ISSN 1862-6300. E-ISSN 1862-6319. Dostupné z: https://doi.org/10.1002/pssa.200982890
Počet záznamů: 1