Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films

FEJFAR, A., VETUSHKA, A., KALUSOVÁ, V., ČERTÍK, O., LEDINSKÝ, M., REZEK, B., STUCHLÍK, J., KOČKA, J. Relation of nanoscale and macroscopic properties of mixed-phase silicon thin films. Physica Status Solidi A. 2010, 207(3), 582-586. ISSN 1862-6300. E-ISSN 1862-6319. Dostupné z: doi: 10.1002/pssa.200982907.