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New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
- 1.SADEWASSER, S., JELÍNEK, P., FANG, C.-K., CUSTANCE, Ó., YAMADA, Y., SUGIMOTO, Y., ABE, M., MORITA, S. New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors. Physical Review Letters. 2009, 103(26), 266103/1-266103/4. ISSN 0031-9007. E-ISSN 1079-7114. Dostupné z: doi: 10.1103/PhysRevLett.103.266103
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