Počet záznamů: 1
Structure and stability of semiconductor tip apexes for atomic force microscopy
- 1.POU, P., GHASEMI, S.A., JELÍNEK, P., LENOSKY, T., GOEDECKER, S., PEREZ, R. Structure and stability of semiconductor tip apexes for atomic force microscopy. Nanotechnology. 2009, 20(26), 264015/1-264015/10. ISSN 0957-4484. E-ISSN 1361-6528. Dostupné z: doi: 10.1088/0957-4484/20/26/264015
Počet záznamů: 1