Digital pixel test structures implemented in a 65 nm CMOS process

AGLIERI RINELLA, G., ANDRONIC, A., ANTONELLI, M., ARESTI, M., ISAKOV, Artem, KOTLIAROV, Artem, KŘÍŽEK, Filip. Digital pixel test structures implemented in a 65 nm CMOS process. Nuclear Instruments & Methods in Physics Research Section A. 2023, 1056(NOV), 168589. ISSN 0168-9002. E-ISSN 1872-9576. Dostupné z: doi: 10.1016/j.nima.2023.168589.