Počet záznamů: 1
Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
- 1.AREZKI, Y., SU, R., HEIKKINEN, V., LEPRETE, F., PSOTA, Pavel, BITOU, Y., SCHOBER, C., MEHDI-SOUZANI, C., ALZAHRANI, B. A. M., ZHANG, X., KONDO, Y., PRÜSS, J., LÉDL, Vít, ANWER, N., BOUAZIZI, M. L., LEACH, R., NOUIRA, H. Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level. Sensors. 2021, 21(4), 1-19), 1103. E-ISSN 1424-8220. Dostupné z: doi: 10.3390/s21041103.
Počet záznamů: 1