Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts?

RODENBURG, C., MASTERS, R., ABRAMS, K., DAPOR, M., KRÁTKÝ, Stanislav, MIKA, Filip. Secondary electron hyper spectral imaging in helios nanolab - mapping materials properties or artefacts? In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 68-69. ISBN 978-80-87441-23-7.