Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

MILOV, I., MAKHOTKIN, I.A., SOBIERAJSKI, R., MEDVEDEV, Nikita, LIPP, V., CHALUPSKÝ, Jaromír, STURM, J.M., TIEDTKE, K., DE VRIES, G., STÖRMER, M., SIEWERT, F., VAN DE KRUIJS, R., LOUIS, E., JACYNA, I., JUREK, M., JUHA, Libor, HÁJKOVÁ, Věra, VOZDA, Vojtěch, BURIAN, Tomáš, SAKSL, K., FAATZ, B., KEITEL, B., PLOENJES, E., SCHREIBER, S., TOLEIKIS, S., LOCH, R., HERMANN, M., STROBEL, S., NIENHUYS, H.-K., GWALT, G., MEY, T., ENKISCH, H., BIJKERK, F. Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. Optics Express. 2018, 26(15), 19665-19685. ISSN 1094-4087. Dostupné z: doi: 10.1364/OE.26.019665