Počet záznamů: 1
Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films
- 1.VETUSHKA, Aliaksi, FEJFAR, Antonín, LEDINSKÝ, Martin, REZEK, Bohuslav, STUCHLÍK, Jiří, KOČKA, Jan. Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films. Physica Status Solidi C. 2010, 7(3-4), 728-731. ISSN 1862-6351. Dostupné z: doi: 10.1002/pssc.200982777.
Počet záznamů: 1