Advanced x-ray optics with Si wafers and slumped glass

HUDEC, René, MARŠÍKOVÁ, V., MÍKA, M., SIK, J., LORENZ, M., PÍNA, L., INNEMAN, A., SKULINOVÁ, Michaela. Advanced x-ray optics with Si wafers and slumped glass. In: O'DELL, S., ed. Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Bellingham: SPIE, 2009, 74370S-1-74370S-12. Proceedings of the SPIE, 7437. ISBN 9780819477279. ISSN 0277-786X. Dostupné z: http://dx.doi.org/10.1117/12.827978