Scintillation secondary electron detector for variable pressure scanning electron microscope

ČUDEK, P., JIRÁK, Josef, NEDĚLA, Vilém. Scintillation secondary electron detector for variable pressure scanning electron microscope. In: MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 221-222. ISBN 978-3-85125-062-6. Dostupné z: http://www.univie.ac.at/asem/Graz_MC_09/papers/95710.pdf