The use of an optically trapped microprobe for scanning details of surface

ŠERÝ, Mojmír, JÁKL, Petr, JEŽEK, Jan, JONÁŠ, Alexandr, ZEMÁNEK, Pavel, LIŠKA, M. The use of an optically trapped microprobe for scanning details of surface. In: Proceedings of the 13th Polish-Czech-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 5259). Washington: SPIEThe International Society for Optical Engineering, 2003, s. 166 - 169.