Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range

0380741 - FZÚ 2013 RIV DK eng J - Článek v odborném periodiku
Oberta, Peter - Platonov, Y. - Flechsig, U.
Investigation of multilayer X-ray optics for 6 keV to 20 keV energy range.
Journal of Synchrotron Radiation. Roč. 19, č. 5 (2012), s. 675-681. ISSN 0909-0495. E-ISSN 1600-5775
Výzkumný záměr: CEZ:AV0Z10100522
Klíčová slova: X-ray optics * multilayer * energy resolution
Kód oboru RIV: BH - Optika, masery a lasery
Impakt faktor: 2.186, rok: 2012
http://journals.iucr.org/s/issues/2012/05/00/issconts.html

The X-ray optics group at the SLS (Swiss Light Source) in co-operation with RIT (Rigaku Innovative Technologies) has investigated seven different multilayer samples. The goal was to find an ideal multilayer structure for the energy range between 6 keV - 20 keV in terms of energy resolution and reflectivity. Such multilayer structures deposited on substrates can be used as X-ray monochromators or reflecting synchrotron mirrors. The measured reflectivities agree with the simulated ones. They are covering a reflectivity range from 45% - 80% for energies between 6 keV - 10 keV and 80% - 90% for energies between 10 keV - 20 keV. The experimentally measured energy resolution of the samples lies between 0.3% - 3.5%.
Trvalý link: http://hdl.handle.net/11104/0211373