Počet záznamů: 1  

Quantitative depth profiling of K-doped fullerene films using XPS and SIMS

  1. 1.
    Oswald, S., Janda, Pavel, Dunsch, L. Quantitative depth profiling of K-doped fullerene films using XPS and SIMS. Microchimica Acta. 2003, 141(1-2), 79-85. E-ISSN 1436-5073.