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Dataset thin film growth of [Ni(Hvanox)2] NanoscaleAdv
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SYSNO ASEP 0618314 Zařazení RIV Záznam nebyl označen do RIV Název Dataset thin film growth of [Ni(Hvanox)2] NanoscaleAdv Tvůrce(i) Sapre, Atharva Umesh (FZU-D) ORCID
Vlček, Jan (FZU-D) RID, ORCID
de Prado, Esther (FZU-D) ORCID, RID
Fekete, Ladislav (FZU-D) RID, ORCID
Klementová, Mariana (FZU-D) RID, ORCID
Vondráček, Martin (FZU-D) RID, ORCID
Svora, Petr (FZU-D) ORCID
Cuza, E. (IE)
Morgan, G.G. (IE)
Honolka, Jan (FZU-D) RID, ORCID
Kühne, Irina A. (FZU-D) ORCIDJazyk dok. eng - angličtina Klíč. slova thin film ; coordination complex ; Ni(II) ; film growth ; thickness dependence Obor OECD Physical chemistry CEP EH22_008/0004596 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy GA23-05878S GA ČR - Grantová agentura ČR LM2023051 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy Institucionální podpora FZU-D - RVO:68378271 DOI https://doi.org/10.57680/asep.0618314 Anotace We have investigated [Ni(Hvanox)2] (H2vanox = o-vanillinoxime), a square-planar Ni(II) complex, for the preparation of thin films using organic molecule evaporation. Low pressure experiments to prepare thin films were conducted at temperatures between 120–150 °C and thin films of increasing thicknesses [Ni(Hvanox)2] (16–336 nm) have been prepared on various substrates and been analyzed by microscopic and spectroscopic methods. Scanning electron microscopy (SEM), atomic force microscopy (AFM) and transmission electron microscopy (TEM) were used to reveal a rough surface morphology which exhibits a dense arrangement of elongated, rod and needle-like nanocrystals with random orientations. It also enabled us to follow the growth of the thin films by increasing thickness revealing the formation of a seeding layer. X-ray photoelectron spectroscopy (XPS and 3D ED), TEM and X-ray diffraction (XRD) were utilized to confirm the atomic structure and the elemental composition of the thin films.
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