TAVAKKOLY, M., CHALUPSKÝ, Jaromír, HÁJKOVÁ, Věra, HILLERT, W., JELÍNEK, Šimon, JUHA, Libor, MAKITA, M., MAZZA, T., MEYER, M., MONTAÑO, J., SINN, H., VOZDA, Vojtěch, VANNONIA, M. Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL. Journal of Synchrotron Radiation. 2024, 31(5), 1067-1070. ISSN 0909-0495. E-ISSN 1600-5775. Dostupné z: https://doi.org/10.1107/S1600577524007318.