Počet záznamů: 1
Dataset for Microstructure and physical properties of black aluminum antireflective films.
- 1.Correa, Cinthia Antunes - More Chevalier, Joris - Hruška, Petr - Poupon, Morgane - Novotný, Michal - Minárik, P. - Hubík, Pavel - Lukáč, František - Fekete, Ladislav - Prokop, Dejan - Hanuš, J. - Valenta, J. - Fitl, Přemysl - Lančok, Ján
Dataset for Microstructure and physical properties of black aluminum antireflective films.
Popis: The files are related to the manuscript „Microstructure and physical properties of Black-Aluminum antireflective films“ and are organized in the sequence of appearance in the manuscript. The nomenclature of the files follows the sequence:
Figure, number of the figure appearing in the manuscript (from 1 – 7), type of data (XRD, AFM, TEM, EDX, PALS, Reflectance, Carrier concentration, Electrical mobility, or resistivity), thin film sample related to (R-Al or B-Al), film thickness (60, 180, 250, 320, or 410 nm).
TEM image files are raw, as collected, while the ones in the manuscript were cropped to show the differences between the films.
Grant CEP: GA ČR GA23-05002S; GA MŠMT(CZ) EH22_008/0004596; GA MŠMT LM2023051
Institucionální podpora: RVO:68378271Institucionální podpora: RVO:61389021
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
DOI: https://doi.org/10.57680/asep.0585608
https://hdl.handle.net/11104/0353281
Počet záznamů: 1