Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors

Kroll, J., Allport, P. P., Chisholm, A., Dudáš, D., Fadeyev, V., George, W., Gonella, L., Kopsalis, I., Kvasnička, J., Latoňová, V., Lomas, J., Martinez-Mckinney, F., Mikeštíková, M., Shi, X., Tůma, P., Ullan, M., Unno, Y. Effect of irradiation and annealing performed with bias voltage applied across the coupling capacitors on the interstrip resistance of ATLAS ITk silicon strip sensors. Nuclear Instruments & Methods in Physics Research Section A. 2023, 1047(Feb), 167726. ISSN 0168-9002. E-ISSN 1872-9576. Dostupné z: doi: 10.1016/j.nima.2022.167726.