Počet záznamů: 1
Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL high energy density instrument
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SYSNO ASEP 0568523 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Direct LiF imaging diagnostics on refractive X-ray focusing at the EuXFEL high energy density instrument Tvůrce(i) Makarov, S. (RU)
Makita, M. (DE)
Nakatsutsumi, M. (DE)
Pikuz, T. (RU)
Ozaki, N. (JP)
Preston, T.R. (DE)
Appel, K. (DE)
Konopková, Z. (DE)
Cerantola, V. (IT)
Brambrink, E. (DE)
Schwinkendorf, J.P. (DE)
Mohacsi, I. (DE)
Burian, Tomáš (FZU-D) RID, ORCID
Chalupský, Jaromír (FZU-D) RID, ORCID
Hájková, Věra (FZU-D) RID, ORCID
Juha, Libor (FZU-D) RID, ORCID, SAI
Vozda, Vojtěch (FZU-D) ORCID
Nagler, B. (US)
Zastrau, U. (DE)
Pikuz, S. (RU)Celkový počet autorů 20 Zdroj.dok. Journal of Synchrotron Radiation. - : Oxford Blackwell - ISSN 0909-0495
Roč. 30, Jan. (2023), s. 208-216Poč.str. 9 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova X-ray free-electron lasers ; X-ray focusing ; X-ray beam characterization ; compound refractive lenses ; focusing system ; lithium fluoride (LiF) detector Vědní obor RIV BH - Optika, masery a lasery Obor OECD Optics (including laser optics and quantum optics) CEP GA20-08452S GA ČR - Grantová agentura ČR GA17-05167s GA ČR - Grantová agentura ČR Způsob publikování Open access Institucionální podpora FZU-D - RVO:68378271 UT WOS 000908417600019 EID SCOPUS 85145536582 DOI https://doi.org/10.1107/S1600577522006245 Anotace The application of fluorescent crystal media in wide-range X-ray detectors provides an opportunity to directly image the spatial distribution of ultraintense X-ray beams including investigation of the focal spot of free-electron lasers. Here the capabilities of the micro- and nano-focusing X-ray refractive optics available at the High Energy Density instrument of the European XFEL are reported, as measured in situ by means of a LiF fluorescent detector placed into and around the beam caustic. The intensity distribution of the beam focused down to several hundred nanometers was imaged at 9 keV photon energy. A deviation from the parabolic surface in a stack of nanofocusing Be compound refractive lenses (CRLs) was found to affect the resulting intensity distribution within the beam. Comparison of experimental patterns in the far field with patterns calculated for different CRL lens imperfections allowed the overall inhomogeneity in the CRL stack to be estimated. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2024 Elektronická adresa https://hdl.handle.net/11104/0341768
Počet záznamů: 1