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Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level
- 1.Arezki, Y., Su, R., Heikkinen, V., Leprete, F., Psota, P., Bitou, Y., Schober, C., Mehdi-Souzani, C., Alzahrani, B. A. M., Zhang, X., Kondo, Y., Prüss, J., Lédl, V., Anwer, N., Bouazizi, M. L., Leach, R., Nouira, H. Traceable reference full metrology chain for innovative aspheric and freeform optical surfaces accurate at the nanometer level. Sensors. 2021, 21(4), 1-19), 1103. E-ISSN 1424-8220. Dostupné z: doi: 10.3390/s21041103.
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