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High resolution powder electron diffraction in scanning electron microscopy
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SYSNO ASEP 0549414 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název High resolution powder electron diffraction in scanning electron microscopy Tvůrce(i) Šlouf, Miroslav (UMCH-V) RID, ORCID
Skoupý, Radim (UPT-D) RID, ORCID, SAI
Pavlova, Ewa (UMCH-V) RID
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAIČíslo článku 7550 Zdroj.dok. Materials. - : MDPI
Roč. 14, č. 24 (2021)Poč.str. 22 s. Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova nanoparticle analysis ; powder nanobeam electron diffraction ; 4D-STEM Vědní obor RIV CD - Makromolekulární chemie Obor OECD Polymer science Vědní obor RIV – spolupráce Ústav přístrojové techniky - Elektronika a optoelektronika, elektrotechnika CEP TN01000008 GA TA ČR - Technologická agentura ČR GA21-13541S GA ČR - Grantová agentura ČR Způsob publikování Open access Institucionální podpora UMCH-V - RVO:61389013 ; UPT-D - RVO:68081731 UT WOS 000738730400001 EID SCOPUS 85121290015 DOI 10.3390/ma14247550 Anotace A modern scanning electron microscope equipped with a pixelated detector of transmitted electrons can record a four-dimensional (4D) dataset containing a two-dimensional (2D) array of 2D nanobeam electron diffraction patterns, this is known as a four-dimensional scanning transmission electron microscopy (4D-STEM). In this work, we introduce a new version of our method called 4D-STEM/PNBD (powder nanobeam diffraction), which yields high-resolution powder diffractograms, whose quality is fully comparable to standard TEM/SAED (selected-area electron diffraction) patterns. Our method converts a complex 4D-STEM dataset measured on a nanocrystalline material to a single 2D powder electron diffractogram, which is easy to process with standard software. The original version of 4D-STEM/PNBD method, which suffered from low resolution, was improved in three important areas: (i) an optimized data collection protocol enables the experimental determination of the point spread function (PSF) of the primary electron beam, (ii) an improved data processing combines an entropy-based filtering of the whole dataset with a PSF-deconvolution of the individual 2D diffractograms and (iii) completely re-written software automates all calculations and requires just a minimal user input. The new method was applied to Au, TbF3 and TiO2 nanocrystals and the resolution of the 4D-STEM/PNBD diffractograms was even slightly better than that of TEM/SAED. Pracoviště Ústav makromolekulární chemie Kontakt Eva Čechová, cechova@imc.cas.cz ; Tel.: 296 809 358 Rok sběru 2022 Elektronická adresa https://www.mdpi.com/1996-1944/14/24/7550
Počet záznamů: 1