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Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices
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SYSNO ASEP 0544223 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Imaging ferroelectric nanodomains in strained BiFeO3 nanoscale films using scanning low-energy electron microscopy: Implications for low-power devices Tvůrce(i) Ma, Haili (UPT-D) SAI
Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Yin, X. (CN)
Sun, F. (CN)
Piňos, Jakub (UPT-D) RID, ORCID, SAI
Vaškovicová, Naděžda (UPT-D) RID, ORCID, SAI
Průcha, Lukáš (UPT-D) ORCID
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Mikmeková, Eliška (UPT-D) RID
Chen, D. (CN)Celkový počet autorů 11 Zdroj.dok. ACS Applied Nano Materials. - : American Chemical Society - ISSN 2574-0970
Roč. 4, č. 4 (2021), s. 3725-3733Poč.str. 9 s. Forma vydání Online - E Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova scanning low-energy electron microscopy (SLEEM) ; BiFeO3 nanoscale films ; ferroelectric nanodomains ; low-loss backscattered electrons ; multiferroic Vědní obor RIV JA - Elektronika a optoelektronika, elektrotechnika Obor OECD Electrical and electronic engineering CEP TN01000008 GA TA ČR - Technologická agentura ČR Způsob publikování Omezený přístup Institucionální podpora UPT-D - RVO:68081731 UT WOS 000644473900047 EID SCOPUS 85105115755 DOI 10.1021/acsanm.1c00204 Anotace Precise control of ferroelectric and multiferroic domain states at the nanoscale is of considerable interest due to the potential to boost the development of next-generation low-energy-consumption nanoelectronic components. Progress in this field is closely related to advances in spatially resolved characterization methods. In this regard, scanning electron microscopy (SEM) as a powerful and highly versatile imaging technique with diversified inner detectors possesses huge potential for scale-bridging microscopy studies (spanning from micrometers to nanometers). Here, both the phase variants and the ordered ferroelectric nanodomains of the tetragonal-like (T) phase in the rhombohedral-like (R) and T mixed-phase BiFeO3 nanoscale film are acquired simultaneously using the surface-sensitive scanning low-energy electron microscopy (SLEEM) for the first time. In particular, backscattered electron (BSE) signals, which bring abundant polarization information, can be utilized to discern polarized discrepancy in mixed-phase BiFeO3 nanoscale films. Furthermore, it is demonstrated that the polarization contrast of nanodomains increases with increasing ratio of the low-loss BSEs in the collected signal. Electron trajectories simulation enables us to optimize and separate morphological and polarization contrast in angle-selective BSEs imaging in the presence of a deceleration field. SLEEM combines with other nanocharacterization and fabrication techniques, such as three-dimensional (3D) atom probe tomography, opening up new opportunities for tackling the complex nanoscale physics and defect chemistry of ferroelectric nanomaterials. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2022 Elektronická adresa https://pubs.acs.org/doi/10.1021/acsanm.1c00204
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