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GaP/Si(001) interface study by XPS in combination with Ar gas cluster ion beam sputtering
- 1.ROMANYUK, O., GORDEEV, I., PASZUK, A., SUPPLIE, O., STOECKMANN, J.P., HOUDKOVÁ, J., UKRAINTSEV, E., BARTOŠ, I., JIŘÍČEK, P., HANNAPPEL, T. GaP/Si(001) interface study by XPS in combination with Ar gas cluster ion beam sputtering. Applied Surface Science. 2020, 514(Jun), 1-8), 145903. ISSN 0169-4332. E-ISSN 1873-5584. Dostupné z: doi: 10.1016/j.apsusc.2020.145903.
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