Počet záznamů: 1
High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I
- 1.MIKULA, P., ŠAROUN, J., STAMMERS, J. H., EM, V. High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I. Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. 2020, 14(SUPPL 1), 146-150. ISSN 1027-4510. E-ISSN 1819-7094. Dostupné z: https://doi.org/10.1134/S1027451020070320.
Počet záznamů: 1